PARTICLE SIZE AND STRAIN FROM X-RAY PEAK PROFILE ANALYSIS (XPPA) OF Mg DOPED TiO2 THIN FILM

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Published: 2015-10-15

Page: 19-28


MANAS R. PANIGRAHI *

Department of Physics, Electroceramics Lab, School of Applied Sciences, KIIT University, Bhubaneswar-24, India

*Author to whom correspondence should be addressed.


Abstract

Mg doped TiO2 micro thick film is synthesized by sol-gel technique. X-ray peak profile analysis (XPPA) is done for micron thick (0.9018 µm) Mg doped TiO2 thick film. The sample is found to be crystalline and in tetragonal phase from X-ray diffraction analysis. Using XPPA the crystallite development in Mg doped TiO2 nanoparticles are investigated. Contribution of crystallite size and lattice strain on the peak broadening of the studied sample is analysed using size-strain plot (SSP) method. The different microstructural parameters for all the reflection peaks of xrd for the whole diffraction range (2θ= 10° - 90°) is estimated and it is seen that the results obtained by SSP method and Scherrer's formula are very similar and comparable with negligible deviation, i.e. they are in good agreement with each other.

Keywords: MgTiO thin film, X-ray diffraction, Peak profile analysis, Size-strain plot


How to Cite

PANIGRAHI, M. R. (2015). PARTICLE SIZE AND STRAIN FROM X-RAY PEAK PROFILE ANALYSIS (XPPA) OF Mg DOPED TiO2 THIN FILM. Journal of Applied Chemical Science International, 5(1), 19–28. Retrieved from https://ikprress.org/index.php/JACSI/article/view/3505

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