Molecular Characterization of Gene Introgression for Bacterial Blight Resistance in Cotton
J. Amudha
Biotechnology Division, Central Institute for Cotton Research Post Bag No. 2, Shankar Nagar Post, Nagpur-440010, India
G. Balasubramani
Biotechnology Division, Central Institute for Cotton Research Post Bag No. 2, Shankar Nagar Post, Nagpur-440010, India
M. K. Meshram
Biotechnology Division, Central Institute for Cotton Research Post Bag No. 2, Shankar Nagar Post, Nagpur-440010, India
V. Gotmare
Biotechnology Division, Central Institute for Cotton Research Post Bag No. 2, Shankar Nagar Post, Nagpur-440010, India
C. D. Mayee
Biotechnology Division, Central Institute for Cotton Research Post Bag No. 2, Shankar Nagar Post, Nagpur-440010, India
*Author to whom correspondence should be addressed.
Abstract
Random Amplified Polymorphic DNA (RAPD) analysis was carried to find the introgression of bacterial blight gene from the wild parent (Gossypium anomalum L.) into the cultivated species of Gossypium hirsutum (MCU5). The introgressions of the resistant trait from the wild species were characterized using 50 decamer primers by amplification in a polymerase chain reaction. Forty primers produced a total of 292 scorable fragments of which 10% were polymorphic. Two RAPD markers with OPF1 primer (1.0 kb and 0.5 kb fragments) were obtained in the Gossypium anomalum and introgressed line of the Gossypium hirsutum parent.
Keywords: Cotton, DNA markers, Gene introgression, Primers, RAPD analysis